Exploring the Benefits of Energy Dispersive X-Ray Spectroscopy Services
Energy Dispersive X-ray Spectroscopy (EDS or EDAX) is a powerful analytical technique that allows PSI to identify and map the composition of your sample. This technique is often combined with scanning electron microscopy (SEM) and is an ideal choice for RoHS testing, material analysis, and failure analysis.
In EDS, a beam of X-rays is scanned across a sample’s surface. It stimulates each atom to emit X-rays of specific energies and at wavelengths characteristic of each element. An EDS detector then measures these X-rays.
Accurate Element Identification
EDS determines the composition of atoms by observing characteristic X-ray emissions. The X-rays emitted are energy-release events caused by an electron beam interaction with the sample volume.
An atom’s ground state, or unexcited electrons, are constrained to discrete energy levels called electron shells. An incident beam may excite an inner electron in a shell, causing it to be ejected from the shell and leave a hole filled by an electron from a higher-energy shell.
The difference between the two energy levels is released as a characteristic X-ray as the outer electron fills the hole. These characteristic X-rays can be measured and reproduced in a spectrum.
Characteristic X-rays are a critical elemental identification tool combined with SEM or TEM analysis. They can also be used for quantitative analysis, determining the concentration of elements within the analyzed volume on a micro- or nano-scale.
Many advantages of EDS: This includes, Spectral information can be gathered from areas as small as one cubic micron: All elements analyzed simultaneously from beryllium (Be) on up the periodic table; relative concentrations in weight, oxide or atomic formula percentages can be obtained from the EDS spectra, State of the art detectors, used in many labs such as Microvision Labs, allow for rapid analysis and compositional analysis in less than a minute, Full data sets are indexed, allowing for additional data analysis and Multiple data points, line profiles, or regions can be compared in a single imaged area
Quantitative Analysis
EDS analysis is a microanalysis technique that provides qualitative and semi-quantitative information on the elemental composition of a sample. You may learn more about how they can assist you with your fundamental characterization needs by going through this site microvisionlabs.com, which identifies metals and polymeric materials with distinctive elemental signatures.
This powerful analytical tool can be used in various applications, including material and product research, troubleshooting, deformulation, and more. It can also map lateral distributions of elements and chemical compositions across surfaces.
X-rays emitted from the sample during bombardment by an electron beam are characteristic and can be used to characterize the elemental composition of a given volume. This enables rapid, quantitative analysis, which helps identify and analyze complex and layered samples.
The EDS spectrum is derived from the ejection of core-shell electrons by atoms in the sample interacting with an electron beam. It is a non-destructive and easy-to-use analytical technique that detects elements from carbon to uranium in quantities as low as 1.0 wt% of the sample.
Enhanced Product Quality
EDS analysis involves the excitation of a sample by an electron beam, typically in an SEM or TEM. This beam ionizes an atom, releasing characteristic X-rays of the elements present.
These characteristic X-rays are characterized by their atomic number and energy. This information can be used to determine the type of elements dissolved in the sample and their concentration.
This type of spectroscopy is also called quantitative X-ray spectroscopy. The rate of X-ray emission is measured, and then the elemental composition can be determined using the corresponding peak values on the X-ray spectrometer display.
Another spectroscopy technique is wavelength dispersive X-ray spectroscopy (WDS). In WDS, a crystal absorbs X-rays, causing the reflected X-rays to be separated into spectra by Bragg’s Law. This enables a more accurate X-ray spectrum to be generated.
Regulatory Compliance
Energy Dispersive X-Ray Spectroscopy is a non-destructive chemical analysis technique that can be coupled with the more well-known electron beam-based techniques of Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). It utilizes a high resolution, low mass x-ray detector to identify characteristic x-rays emitted by elements with atomic numbers ranging from carbon to up.
EDX is an excellent choice for elemental identification, quality control, and process improvement applications, including metals, polymers, chemical, and environmental testing. Its most impressive feature is a spectrometer that can accurately measure the quantity and energy of x-rays generated by the sample to provide accurate characterization at the microscopic level. The best part is that it is non-destructive and can be done without affecting the piece’s quality. Using the right technology for your application is critical to meeting regulatory requirements and getting your product to market quickly.
